Title | Type | SJR | H index | Total Docs. (1999) | Total Docs. (3years) | Total Refs. (1999) | Total Cites (3years) | Citable Docs. (3years) | Cites / Doc. (2years) | Ref. / Doc. (1999) | ||
---|---|---|---|---|---|---|---|---|---|---|---|---|
1 | Journal of Vacuum Science and Technology B | journal | 1.723 Q1 | 124 | 633 | 2078 | 8916 | 3291 | 2078 | 1.48 | 14.09 | |
2 | Applied Spectroscopy | journal | 1.294 Q1 | 122 | 250 | 818 | 5866 | 1459 | 780 | 1.70 | 23.46 | |
3 | Applied Spectroscopy Reviews | journal | 1.256 Q1 | 81 | 6 | 38 | 83 | 72 | 38 | 1.62 | 13.83 | |
4 | Optical Fiber Technology | journal | 1.152 | 73 | 31 | 111 | 620 | 139 | 108 | 1.57 | 20.00 | |
5 | Review of Scientific Instruments | journal | 0.979 Q1 | 180 | 874 | 2579 | 14486 | 2776 | 2567 | 1.17 | 16.57 | |
6 | IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control | journal | 0.808 Q1 | 154 | 178 | 466 | 3364 | 500 | 465 | 1.03 | 18.90 | |
7 | Field Analytical Chemistry and Technology | journal | 0.800 Q1 | 34 | 33 | 75 | 682 | 91 | 75 | 1.05 | 20.67 | |
8 | Journal of Dynamic Systems, Measurement and Control, Transactions of the ASME | journal | 0.702 Q2 | 99 | 114 | 349 | 1894 | 256 | 349 | 0.63 | 16.61 | |
9 | IEEE Transactions on Instrumentation and Measurement | journal | 0.590 Q2 | 149 | 256 | 713 | 2699 | 341 | 711 | 0.44 | 10.54 | |
10 | Accreditation and Quality Assurance | journal | 0.585 Q2 | 44 | 84 | 136 | 1343 | 81 | 136 | 0.61 | 15.99 | |
11 | Microscopy Research and Technique | journal | 0.573 Q2 | 131 | 164 | 551 | 10124 | 640 | 535 | 1.14 | 61.73 | |
12 | Laser Physics | journal | 0.417 Q2 | 61 | 172 | 548 | 3696 | 330 | 548 | 0.61 | 21.49 | |
13 | Journal of Laser Applications | journal | 0.388 Q2 | 64 | 41 | 118 | 667 | 85 | 118 | 0.63 | 16.27 | |
14 | Journal of Infrared, Millimeter, and Terahertz Waves | journal | 0.376 Q2 | 70 | 179 | 488 | 1952 | 164 | 488 | 0.38 | 10.91 | |
15 | Scanning | journal | 0.319 Q3 | 56 | 37 | 481 | 601 | 143 | 480 | 0.33 | 16.24 | |
16 | Instrumentation Science and Technology | journal | 0.282 Q3 | 35 | 73 | 288 | 1328 | 164 | 288 | 0.45 | 18.19 | |
17 | Scanning Microscopy | journal | 0.277 Q3 | 16 | 0 | 97 | 0 | 52 | 97 | 0.00 | 0.00 | |
18 | IEEE Circuits and Devices Magazine | journal | 0.274 Q3 | 35 | 25 | 97 | 288 | 48 | 97 | 0.42 | 11.52 | |
19 | Powder Diffraction | journal | 0.242 Q3 | 50 | 60 | 155 | 843 | 60 | 152 | 0.33 | 14.05 | |
20 | ISA Transactions | journal | 0.225 Q3 | 109 | 33 | 107 | 391 | 19 | 107 | 0.15 | 11.85 | |
21 | Nonlinear Optics Quantum Optics | journal | 0.216 Q3 | 22 | 193 | 202 | 2415 | 54 | 200 | 0.34 | 12.51 | |
22 | Measurement Techniques | journal | 0.192 Q4 | 25 | 202 | 644 | 1570 | 10 | 644 | 0.01 | 7.77 | |
23 | Journal of Analytical Methods in Chemistry | journal | 0.190 Q4 | 38 | 10 | 216 | 189 | 37 | 214 | 0.42 | 18.90 | |
24 | Instruments and Experimental Techniques | journal | 0.143 Q4 | 37 | 177 | 593 | 1608 | 36 | 593 | 0.04 | 9.08 | |
25 | Measurement and Control | journal | 0.143 Q4 | 32 | 47 | 140 | 318 | 31 | 140 | 0.21 | 6.77 | |
26 | Hewlett-Packard Journal | journal | 0.116 Q4 | 14 | 0 | 172 | 0 | 23 | 172 | 0.13 | 0.00 | |
27 | IEEE Instrumentation and Measurement Magazine | journal | 0.111 Q4 | 54 | 36 | 22 | 176 | 2 | 20 | 0.09 | 4.89 |
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